Spectroscopic ellipsometry of nanocrystalline diamond film growth data

The files form the data collected on the application of spectroscopic ellipsometry to the initial stages of nanocrystalline diamond film growth. The data is organised by characterisation technique and then sample number, with the growth parameters of the samples detailed within the spreadsheet entitled "samples".  In addition to the data contained within the publication the dataset includes data obtained on with varying growth parameters as well as X-ray reflectivity scans obtained on all samples. Finally, X-ray measurements were also performed on a Bias Enhanced Nucleation (BEN) seeded Ir on MgO substrate.

The SEM and AFM folders contain .tif and .tiff files of each of the images taken, the Raman folder contains .txt files of the spectra with wavenumber and intensity representing each column, and the SE folder contains .SE files for use with the CompleteEASE software by Woollam. Finally, the XRay folder contains .dat files of each scan performed and a speadsheet entitled "XRayScans" that link the scan numbers to each sample.  The relevant .tif files captured at each stage of the scan and listed within the .dat files can then be found within the pilatus1 folder.

Research results based upon these data are published at http://doi.org/10.1021/acsomega.7b00866