Scanning electron microscopy, atomic and magnetic force microscopy and simulation data of a single Nickel nanowire

A single Nickel nanowire has been characterised using 3 experimental techniques.

Scanning electron microscope (SEM) data folder contains a single .TIFF image of a fallen Nickel nanowire, where the title refers to the name of the sample.

Atomic and magnetic force micrscope (AFM and MFM) data folder contains raw output data where titles refer to the name of the sample (181017JA) and the magnetic field applied (eg 0mT), from software Nanoscope 5, these can be opened in any AFM processing software such as Gwyddion or WSxM. Each file contains data regarding the height (corresponding to AFM) and the phase (corresponding to the MFM).

Simulation data folder contains .VTS files where the titles correspond to the appropriate field applied to the simulated wire. The file type .VTS can be opened and viewed within a 3D visualisation program such as Paraview.   

Research results based upon these data are published at https://doi.org/10.3390/nano10030429