Microwave cavity measurements and XRD spectra for annealed aluminium samples

The resonator parameters (frequency, Q-factor, insertion loss and 3dB bandwidth) are provided as produced from the lorenzian curve fitting procedure undertaken in software at the time of acquisition. Data is provided in the TDMS file format whereby each parameter is a separate data channel as it progresses in time. The different resonant modes and temperature data are organised into separate data groups. Each file is provided with a text file (.ini extension) which lists the network analyser parameters used for acquisition. 

The XRD data is provided in a simple plain text 2 column format (2theta and arbitrary intensity). The exposure time for each sample is identical so the data sets can be directly compared. The data has had the background pattern removed but still contains the Cu-Kalpha2 secondary peaks.