InAsP and InP quantum dot laser structure data

Lasers are characterised in terms of the external voltage and light output from a single facet in terms of the current through the laser diode. Data is available in .IV extension files with a 2 column format for voltage (V) and for current (mA) and no extension files with a 2 column format for current (mA) and light (arbitrary units). At least 2 devices of length 1,2,3 and 4mm and of nominal 50um width are measured and results for different heat sink temperature are in individually named files. Each file has a text header with descriptive data. Threshold current densities are produced using widths derived from the FWHM of optical near field measurements. This data is in the form of intensity versus pixel number from a ccd camera and pixel number is calibrated against the measured device width. Light output is also measured using a calibrated integrating sphere (OPHIR 3A-IS-V1) as a function of current and voltage at room temperature (23degC). The power measurements are given as time averages of pulsed drive, which has a duty cycle of 0.1%, in W. Lasing spectra are measured using an ANDO AQ-6315B spectrum analyser and the data is recorded as intensity in arbitrary units versus wavelength in nm. Gain and absorption spectra are derived using the segmented contact method and the raw data is in the form of amplified spontaneous emission (ASE) spectra from section 1, section 2 (for absorption data)and section 1 and section 1+2 (for gain data). All ASE data is in 2 column format with intensity in arbitrary units versus wavelength in nm.
Research results are published at http://dx.doi.org/10.1364/OE.23.027282