Coverage and Fluctuations Data for: 'Unified method for measuring entropy differences between coexisting surface phases using Low energy electron microscopy'

The data includes series of raw .dat and .tif images made with the Elmitec LEEM-MBE microscope in Cardiff. The data consists of grayscale 1024x1024 images. Two sets of experiments are done to find fundamental parameters for the GaAs(001) surface. That surface is explored during the coexistence between the (6x6) and c(8x2) phases. The data includes Bright Field images, isolating the (00) spot of the diffraction pattern, and Dark Field images, isolating the (6x6) and c(8x2) phases. During Bright Field, the (6x6) phase appears as dark patches on the surface, while the c(8x2) apperas as bright patches.

The first set of data aims at describing the bahaviour of the coverage of the two phases with temperature. As such, it is done in small temperature steps and is done slowly to ensure equilibrium. The second set of data focuses on the fluctuations of the boundaries between the two phases. it is done at the limit of the spacial and temporal resolutions of the microscope, recording close images in different areas of the surface. Both sets of data are analysed, as shown in the associated publication to reach values for the stress difference and entropy difference between the (6x6) and c(8x2) phases.

The data can be opened using ImageJ, the Python wrappers provided in the git repository: https://github.com/M-A-Ivanov/LEEM_SubPixelEdgeAnalysis. Results of the Fluctuation analysis are uploaded as Python pickle files. They can be accessed through the built-in pickle library, and through the scripts in the git repository.

Research results based upon these data are published at https://doi.org/10.1103/PhysRevResearch.4.033163